Low Frequency Noise in Tantalum Capacitors

Abstract

Noise has been measured in a number of biased solid tantalum capacitors at frequencies down to 0.01 Hz. The noise current was found to have a 1/f power spectrum, and the amplitude varied with the bias voltage with a law in the range 1st to 4th power. There was a large difference in amplitudes between different capacitors of the same type. © 1987, Gordon and Breach Science Publishers, Inc.