Polycrystalline thin films, deposited from a vapour phase, often show a columnar morphology. We present computer simulations of a 2D model of the polycrystalline growth process. The model consists of randomly oriented squares, growing from a line. We find, that the characteristic length scale < Δ x > of the growing surface (average edge length projected on the substrate) diverges as a function of time according to a power law < x > ∼ t p , with p ≈ 0.52.
CITATION STYLE
Dammers, A. J., & Radelaar, S. (1991). Two‐Dimensional Computer Modelling of Polycrystalline Film Growth. Texture, Stress, and Microstructure, 14(1), 757–762. https://doi.org/10.1155/tsm.14-18.757
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