High Critical Current Densities in Nb3Sn Films with Engineered Microstructures — Artificial Pinning Microstructures

Dietderich, D. R., Kelman, M., Litty, J. R., & Scanlan, R. M. (1998). High Critical Current Densities in Nb3Sn Films with Engineered Microstructures — Artificial Pinning Microstructures. In Advances in Cryogenic Engineering Materials (pp. 951–958). Springer US. https://doi.org/10.1007/978-1-4757-9056-6_125