CITATION STYLE
Bleloch, A. L., Gass, M., Jiang, L., Mendis, B., Sader, K., & Wang, P. (2009). Aberration corrected STEM and EELS: Atomic scale chemical mapping. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 1–2). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_1
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