Application of spherical-aberration corrected electron microscopy to nano-materials

Abstract

Recent development of spherical aberration correction in high-resolution transmission electron microscopy (Cs-corrected HRTEM) is reviewed by focusing on its application to nano-materials. Basis of the HRTEM imaging and new scientific advantage of Cs-corrected TEM are summarized, and recent applications of the method to high resolution imaging and selected area electron diffraction of nanomaterials and interfaces are described as well as explaining its characteristic and the future prospects.