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Testing Win X-ray, a Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope

  • Campbell H
  • Gauvin R
Microscopy and Microanalysis (2005) 11(S02)
DOI: 10.1017/s1431927605510729
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005.

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APA

Campbell, H., & Gauvin, R. (2005). Testing Win X-ray, a Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope. Microscopy and Microanalysis, 11(S02). https://doi.org/10.1017/s1431927605510729

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