Properties and origins of different stacking faults that cause degradation in SiC PiN diodes

Jacobson, H., Bergman, J. P., Hallin, C., Janzén, E., Tuomi, T., & Lendenmann, H. (2004). Properties and origins of different stacking faults that cause degradation in SiC PiN diodes. Journal of Applied Physics, 95(3), 1485–1488. https://doi.org/10.1063/1.1635996