Abstract
A method is described for measuring the thickness of a flowing liquid film by the use of laser scattering from suspended latex particles. The apparatus described has a linear voltage to film thickness relationship, unlike capacitance and resistance methods.
Cite
CITATION STYLE
APA
Salazar, R. P., & Marschall, E. (1975). Thickness measurement in liquid film flow by laser scattering. Review of Scientific Instruments, 46(11), 1539–1541. https://doi.org/10.1063/1.1134099
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