We present x-ray diffraction studies of a CdSe distribution profile along the growth direction in CdSe/ZnSe submonolayer superlattices (SLs) grown by molecular beam epitaxy. The performed theoretical simulations show that the shape of both (004)- and (002)-reflection rocking curves is very sensitive to the vertical CdSe distribution around the intended deposition yplanes. In particular, broadening of the CdSe submonolayer insertions results in a decrease in SL (± 1) and (± 2) satellite intensities. Comparison of the simulations and experimental data allows us to conclude that CdSe sheets in the as-grown SL samples are asymmetrically broaden up to 5 monolayers. © 1999 American Institute of Physics.
CITATION STYLE
Kyutt, R. N., Toropov, A. A., Sorokin, S. V., Shubina, T. V., Ivanov, S. V., Karlsteen, M., & Willander, M. (1999). Broadening of submonolayer CdSe sheets in CdSe/ZnSe superlattices studied by x-ray diffraction. Applied Physics Letters, 75(3), 373–375. https://doi.org/10.1063/1.124379
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