CITATION STYLE
Walther, T. (2008). Quantifying the Top-Bottom Effect in Energy-Dispersive X-Ray Spectroscopy of Nanostructures Embedded in Thin Films. In Microscopy of Semiconducting Materials 2007 (pp. 185–188). Springer Netherlands. https://doi.org/10.1007/978-1-4020-8615-1_40
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