Dependence of the source performance on plasma parameters at the BATMAN test facility

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Abstract

The investigation of the dependence of the source performance (high jH - , low j e ) for optimum Cs conditions on the plasma parameters at the BATMAN (Bavarian Test MAchine for Negative hydrogen ions) test facility is desirable in order to find key parameters for the operation of the source as well as to deepen the physical understanding. The most relevant source physics takes place in the extended boundary layer, which is the plasma layer with a thickness of severalcm in front of the plasma grid: the production of H - , its transport through the plasma and its extraction, inevitably accompanied by the co-extraction of electrons. Hence, a link of the source performance with the plasma parameters in the extended boundary layer is expected. In order to characterize electron and negative hydrogen ion fluxes in the extended boundary layer, Cavity Ring-Down Spectroscopy and Langmuir probes have been applied for the measurement of the H - density and the determination of the plasma density, the plasma potential and the electron temperature, respectively. The plasma potential is of particular importance as it determines the sheath potential profile at the plasma grid: depending on the plasma grid bias relative to the plasma potential, a transition in the plasma sheath from an electron repelling to an electron attracting sheath takes place, influencing strongly the electron fraction of the bias current and thus the amount of co-extracted electrons. Dependencies of the source performance on the determined plasma parameters are presented for the comparison of two source pressures (0.6 Pa, 0.45 Pa) in hydrogen operation. The higher source pressure of 0.6 Pa is a standard point of operation at BATMAN with external magnets, whereas the lower pressure of 0.45 Pa is closer to the ITER requirements (p ≤ 0.3 Pa).

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CITATION STYLE

APA

Wimmer, C., & Fantz, U. (2015). Dependence of the source performance on plasma parameters at the BATMAN test facility. In AIP Conference Proceedings (Vol. 1655). American Institute of Physics Inc. https://doi.org/10.1063/1.4916446

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