Abstract
A reduction in the number of parameters involved in the statistical compact model parameter extraction is necessary for the development of scalable compact modelling strategy. The impact of size of parameter set on the quality of statistical compact modelling is investigated in detail by HSPICE simulation at both device and circuit levels. Principal component analysis (PCA) is employed on a two-parameter set to demonstrate the possibility to corporate it into scalable statistical compact modelling strategy.
Cite
CITATION STYLE
Cheng, B., Roy, S., & Asenov, A. (2007). Statistical compact model parameter extraction strategy for intrinsic parameter fluctuation. In 2007 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2007 (pp. 301–304). Springer-Verlag Wien. https://doi.org/10.1007/978-3-211-72861-1_72
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