CITATION STYLE
Nietzsche, S., Schmidt, A., Kothe, E., Westermann, M., & Richter, W. (2008). Scanning electron microscopic analysis of heavy metal resistant microorganisms. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 129–130). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85228-5_65
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