Optical-Field-Driven Electron Tunneling in Metal–Insulator–Metal Nanojunction

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Abstract

Optical-field driven electron tunneling in nanojunctions has made demonstrable progress toward the development of ultrafast charge transport devices at subfemtosecond time scales, and have evidenced great potential as a springboard technology for the next generation of on-chip “lightwave electronics.” Here, the empirical findings on photocurrent the high nonlinearity in metal–insulator–metal (MIM) nanojunctions driven by ultrafast optical pulses in the strong optical-field regime are reported. In the present MIM device, a 14th power-law scaling is identified, never achieved before in any known solid-state device. This work lays important technological foundations for the development of a new generation of ultracompact and ultrafast electronics devices that operate with suboptical-cycle response times.

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CITATION STYLE

APA

Zhou, S., Guo, X., Chen, K., Cole, M. T., Wang, X., Li, Z., … Dai, Q. (2021). Optical-Field-Driven Electron Tunneling in Metal–Insulator–Metal Nanojunction. Advanced Science, 8(24). https://doi.org/10.1002/advs.202101572

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