Hydrogenated Nanocrystalline Silicon Investigated by Conductive Atomic Force Microscopy

Cavallini, A., Cavalcoli, D., Rossi, M., Tomasi, A., Pichaud, B., Texier, M., … Isella, G. (2008). Hydrogenated Nanocrystalline Silicon Investigated by Conductive Atomic Force Microscopy. In Microscopy of Semiconducting Materials 2007 (pp. 301–304). Springer Netherlands. https://doi.org/10.1007/978-1-4020-8615-1_65