Introduction

Abstract

Atom probe microscopy (APM) is a term that encompasses the various imaging and microanalysis techniques that derive from field ionisation, field emission and field evaporation. Amongst other things, APM provides three-dimensional (3D) analytical mapping of materials with atomic-scale resolution and so offers unique insights into both the chemical composition and atomic structure of matter. Although APM techniques were once considered a niche area of high-field physics and surface science, their development has resulted in a powerful microscope that is now an established method for materials characterisation at the atomic scale. Today, APM is recognised as a burgeoning, mainstream microscopy technique, evidenced by a dramatic recent increase in the number of academic and industrial laboratories worldwide that now have APM capabilities.