The Long Trace Profiler (LTP) is the most commonly employed instrument for measuring grazing incidence optics used in synchrotron radiation. This is a direct slope measurement device, able to detect root mean square slope variations of the order of 0.1 μrad. It was originally developed at the Brookhaven National Laboratory in Upton, NY, but several custom modified devices are used at laboratories around the world. In this chapter the main principles as well as various modifications are described, in order to give a general overview of what is possible with such instruments.
CITATION STYLE
Rommeveaux, A., Thomasset, M., & Cocco, D. (2008). The Long Trace Profilers. In Springer Series in Optical Sciences (Vol. 137, pp. 181–191). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/978-3-540-74561-7_10
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