The transistor stack is a leakage reduction technique which works both in active and stand-by mode. It is based on the observation that two off-state transistors connected in series cause significantly less leakage than a single device. The leakage current of the stack is even smaller than the leakage of a single device with double channel length. Corresponding to eq. 1.5, doubling the channel length reduces the off-current by a factor of two. However, in modern deep sub-micron devices the threshold voltage may decrease for longer channels due to the reverse short channel effect. Therefore, leakage reduction is less effective. Fig. 4.1 shows a schematic of an NMOS transistor stack. The threshold voltage is modeled linearly by
CITATION STYLE
Henzler, S. (2007). FORCING OF TRANSISTOR STACKS. In Springer Series in Advanced Microelectronics (Vol. 25, pp. 61–68). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/1-4020-5081-X_4
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