Carrier-envelope phase detection by interference between surface harmonics

Abstract

We demonstrate a measurement that provides direct information about the carrier-envelope phase (CEP) using a few-cycle laser pulse. The measurement is based on the interference between the second and third harmonics. The interference intensity is sensitive to the CEP. This result for low-energy pulses will lead to a new technique for measuring the CEP. © 2007 Springer-Verlag New York.