Abstract
We present new metrics and techniques which allow one to configure a metadata catalogue and objectively describe knowledge management ontologies. Per C.E. Shannon (1948), when describing information based systems, statistical measures are a necessity; yet very few ontology based standards mention quantifiable measures such as entropy, data encapsulation, complexity, efficiency, evolution, or redundancy. We hope to demonstrate how statistical information measures can be implemented for ontology-based knowledge management systems using our Lo statistic, entropy, evolution, organization, sensitivity, and an interpretation of complexity.
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CITATION STYLE
Pefferly, R. J., Jaeger, M. C., & Lo, M. (2005). Metrics for objective ontology evaluations. In IFIP Advances in Information and Communication Technology (Vol. 188, pp. 187–197). Springer New York LLC. https://doi.org/10.1007/0-387-29248-9_11
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