Microwave calibration of qubit drive line components at millikelvin temperatures

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Abstract

Systematic errors in qubit state preparation arise due to non-idealities in qubit control lines such as impedance mismatch. Using a data-based methodology of short-open-load calibration at a temperature of 30 mK, we report calibrated 1-port scattering parameter data of individual qubit drive line components. At 5 GHz, cryogenic return losses of a 20-dB-attenuator, a 10-dB-attenuator, a 230-mm-long 0.86-mm silver-plated cupronickel coaxial cable, and a 230-mm-long 0.86-mm NbTi coaxial cable were found to be 35 - 2 + 3 dB, 33 - 2 + 3 dB, 34 - 2 + 3 dB, and 29 - 1 + 2 dB, respectively. For the same frequency, we also extract cryogenic insertion losses of 0.99 - 0.04 + 0.04 dB and 0.02 - 0.04 + 0.04 dB for the coaxial cables. We interpret the results using master equation simulation of all XY gates performed on a single qubit. For example, we simulate a sequence of two 5 ns gate pulses (X and Y) through a two-element Fabry-Pérot cavity with 276-mm path length directly preceding the qubit and establish that the return loss of its reflective elements must be >9.7 dB (>14.7 dB) to obtain 99.9% (99.99%) gate fidelity.

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APA

Simbierowicz, S., Monarkha, V. Y., Singh, S., Messaoudi, N., Krantz, P., & Lake, R. E. (2022). Microwave calibration of qubit drive line components at millikelvin temperatures. Applied Physics Letters, 120(5). https://doi.org/10.1063/5.0081861

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