Fresnel calculations of double/multi-layer antireflection coatings on silicon substrates

Abstract

Reflectance spectra calculations of double and multi-layer antireflection coating (ARC) structures based on Fresnel equations were studied in this work. A detailed explanation of Fresnel equations was presented with different polarization of incoming light for multi-layer antireflection coatings for solar cell applications. TiO2/SiNx, MgF2/ZnS thin film stacks for double layer ARC and SiO2/Al2O3/TiO2, MgF2/SiO2/TiO2 thin film stacks for multi-layer ARC were studied. Transfer matrix method and PC1D simulation software were used additionally to simulate crystalline silicon solar cells with considered double and multi-layer ARC films on their front surface with calculated thicknesses. Average reflectance (400-1100 nm) of silicon surface by Fresnel equations with triple layer ARC was around 2.72%. Solar cell performances with each ARC structure were compared to evaluate the achieved output of reflectance of investigated thin films. Simulated short circuit current density of solar cells with tri-layer ARC was 39.71 mA/cm2, was significantly higher than that of the ARC-free solar cells resulting in an efficiency of 19.1%.