An emotion classification method from electroencephalogram based on 1/f fluctuation theory

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Abstract

Electroencephalogram data are easily affected by artifacts, and a drift may occur during the signal acquisition process. At present, most research focuses on the automatic detection and elimination of artifacts in electrooculograms, electromyograms and electrocardiograms. However, electroencephalogram drift data, which affect the real-time performance, are mainly manually calibrated and abandoned. An emotion classification method based on 1/f fluctuation theory is proposed to classify electroencephalogram data without removing artifacts and drift data. The results show that the proposed method can still achieve a great classification accuracy of 75% in cases in which artifacts and drift data exist when using the support vector machine classifier. In addition, the real-time performance of the proposed method is guaranteed.

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Li, H., Mao, X., & Chen, L. (2020). An emotion classification method from electroencephalogram based on 1/f fluctuation theory. Measurement and Control (United Kingdom), 53(5–6), 824–832. https://doi.org/10.1177/0020294020913893

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