Basic Technique for Preparation of down for Examination with the Scanning Electron Microscope

  • Laybourne R
  • Sabo B
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Abstract

JSTOR is a not-for-profit service that helps scholars, researchers, and students discover, use, and build upon a wide range of content in a trusted digital archive. We use information technology and tools to increase productivity and facilitate new forms of scholarship. For more information about JSTOR, please contact support@jstor.org.. University of California Press and American Ornithologists' Union are collaborating with JSTOR to digitize, preserve and extend access to The Auk.

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Laybourne, R. C., & Sabo, B. A. (1992). Basic Technique for Preparation of down for Examination with the Scanning Electron Microscope. The Auk, 109(1), 195–197. https://doi.org/10.2307/4088284

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