CITATION STYLE
Ubaldi, F., Pozzi, G., Fazzini, P. F., & Beleggia, M. (2008). Three-Dimensional Field Models for Reverse Biased P-N Junctions. In Microscopy of Semiconducting Materials 2007 (pp. 383–386). Springer Netherlands. https://doi.org/10.1007/978-1-4020-8615-1_82
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