Scanning conductive torsion mode microscopy

Abstract

In this chapter, we introduce a special non-contact scanning probe based current sensing technique: scanning conductive torsion mode microscopy (SCTMM), which allows for simultaneous topography and electrical current mapping on solid samples. Due to the low interacting force between the probe and sample surface, this new technique is particularly indicated for and usually applied to measurements on soft materials and fragile structures. We first describe the working principle and discuss the advantages of the technique and its limitations. We also review recent applications of this technique, including studies of structure-properties relationship, local conductivity of nanopillar arrays, electropolymerization of conjugated polymers, and molecular orientation of self-assembly structures. In the end, we discuss some potential improvements of future scanning probe based current sensing techniques.