X-ray diffraction and transmission electron microscopy (TEM) provide complementary structural data on semiconductor quantum dots. While TEM characterizes single structures with atomic resolution X-ray diffraction yields information on statistical averages of large...
CITATION STYLE
Köhler, R., Neumann, W., Schmidbauer, M., Hanke, M., Grigoriev, D., Schäfer, P., … Schneider, R. (2008). Structural Characterisation of Quantum Dots by X-Ray Diffraction and TEM (pp. 97–121). https://doi.org/10.1007/978-3-540-77899-8_5
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