Skip to main content
Book Chapter

Characterizing Langmuir-Blodgett Layers by Infrared Ellipsometry

  • Röseler A
  • Dietel R
  • Korte E
Springer Vienna, (1997), 657-659
DOI: 10.1007/978-3-7091-6840-0_169
N/ACitations
Citations of this article
1Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Langmuir-Blodgett layers consisting of a few monolayers on a metal substrate were studied by infrared ellipsometry. The geometrical thickness and the background level of the refractive index can be precisely derived from phase shifts where absorption is negligible. With a subsequent oscillator fit, the spectra of the optical constants are determined.

Cite

CITATION STYLE

APA

Röseler, A., Dietel, R., & Korte, E. H. (1997). Characterizing Langmuir-Blodgett Layers by Infrared Ellipsometry. In Progress in Fourier Transform Spectroscopy (pp. 657–659). Springer Vienna. https://doi.org/10.1007/978-3-7091-6840-0_169

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free