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Deflectometry: 3D-Metrology from nanometer to meter

Fringe 2009 - 6th International Workshop on Advanced Optical Metrology (2009) 416-421
DOI: 10.1007/978-3-642-03051-2_68
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Häusler, G., Knauer, M. C., Faber, C., Richter, C., Peterhänsel, S., Kranitzky, C., & Veit, K. (2009). Deflectometry: 3D-Metrology from nanometer to meter. In Fringe 2009 - 6th International Workshop on Advanced Optical Metrology (pp. 416–421). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/978-3-642-03051-2_68

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