In the preceding chapter, we described how to obtain a variety of CBED patterns under various experimental conditions. In this chapter you will find out why these patterns are so useful: they contain a wealth of quantitative data, much of which you can't obtain by any other technique and many of which augment standard X-ray crystallographic methods (but always at higher spatial resolution). The established techniques largely depend on simple observation of the patterns whereas newer techniques involve quantitative simulations of the patterns.
CITATION STYLE
Williams, D. B., & Carter, C. B. (1996). Using Convergent-Beam Techniques. In Transmission Electron Microscopy (pp. 319–345). Springer US. https://doi.org/10.1007/978-1-4757-2519-3_21
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