Using Convergent-Beam Techniques

  • Williams D
  • Carter C
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Abstract

In the preceding chapter, we described how to obtain a variety of CBED patterns under various experimental conditions. In this chapter you will find out why these patterns are so useful: they contain a wealth of quantitative data, much of which you can't obtain by any other technique and many of which augment standard X-ray crystallographic methods (but always at higher spatial resolution). The established techniques largely depend on simple observation of the patterns whereas newer techniques involve quantitative simulations of the patterns.

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Williams, D. B., & Carter, C. B. (1996). Using Convergent-Beam Techniques. In Transmission Electron Microscopy (pp. 319–345). Springer US. https://doi.org/10.1007/978-1-4757-2519-3_21

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