Direction-free magnetic field application system

Abstract

To observe the dynamical behavior of superconducting vortices and the motion of domain structure in magnetic materials by transmission electron microscopy (TEM), it is important that the direction of an external magnetic field applied to the specimen can be adjusted appropriately as well as the electro-optical axis, the crystalline orientation and morphological orientation of the specimens. Direction-free magnetic field application system that has three coil-pairs for generating and controlling the external magnetic field in any direction was developed to achieve the purpose. The system also has twenty-four coils to compensate the deflected electron beam by the external magnetic field applied. The system has been installed in the 1-MV and 300-kV field emission electron microscopes to utilize application research works. © 2008 The Surface Science Society of Japan.