RTN and its intrinsic interaction with statistical variability sources in advanced nano-scale devices: A simulation study

Adamu-Lema, F., Monzio Compagnoni, C., Badami, O., Georgiev, V., & Asenov, A. (2020). RTN and its intrinsic interaction with statistical variability sources in advanced nano-scale devices: A simulation study. In Noise in Nanoscale Semiconductor Devices (pp. 441–466). Springer International Publishing. https://doi.org/10.1007/978-3-030-37500-3_13