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A tutorial introduction to DCM quantitative characterization and modelling of material microstructures using monochromatic multi-energy X-ray CT

AIP Conference Proceedings (2016) 1696
DOI: 10.1063/1.4937523
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Abstract

This article is intended as a tutorial guide for new users of the DCM (data-constrained modelling) software for quantitative characterization of material 3D microstructures using multi-energy X-ray CT data. It guides users through the steps necessary for processing a small CIPS (Calcite In-situ Precipitation System) sandstone data set. It also covers some built-in and plug-in features to analyze and visualize the microstructures.

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APA

Yang, Y. S., Trinchi, A., Tulloh, A., & Chu, C. (2016). A tutorial introduction to DCM quantitative characterization and modelling of material microstructures using monochromatic multi-energy X-ray CT. In AIP Conference Proceedings (Vol. 1696). American Institute of Physics Inc. https://doi.org/10.1063/1.4937523

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