We employ three dimensional x-ray coherent diffraction imaging to map the lattice strain distribution, and to probe the elastic properties of a single crystalline Ni (001) nanowire grown vertically on an amorphous SiO 2 Si substrate. The reconstructed density maps show that with increasing wire width, the equilibrium compressive stress in the core region decreases sharply while the surface tensile strain increases, and gradually trends to a nonzero constant. We use the retrieved projection of lattice distortion to predict the Young's Modulus of the wire based on the elasticity theory. © 2012 American Institute of Physics.
CITATION STYLE
Fohtung, E., Kim, J. W., Chan, K. T., Harder, R., Fullerton, E. E., & Shpyrko, O. G. (2012). Probing the three-dimensional strain inhomogeneity and equilibrium elastic properties of single crystal Ni nanowires. Applied Physics Letters, 101(3). https://doi.org/10.1063/1.4737440
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