Abstract
Diffraction and bandwidth limited pulses from 10 to 100 femtoseconds in the focal plane of microscope objectives are used to perform multiphoton current and luminescence microscopy of nonlinear photodetectors. Information on material parameters and the electric field distribution is obtained.
Cite
CITATION STYLE
APA
Dorn, P., Jasapara, J., Zeller, J., Rudolph, W., & Sheik-Bahae, M. (1998). Femtosecond nonlinear microscopy of photodetectors. Springer Series in Chemical Physics, 63, 165–167. https://doi.org/10.1007/978-3-642-72289-9_50
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.
Already have an account? Sign in
Sign up for free