THz transient photoconductivity of the III-V dilute nitride GaP y As1-y-xN x

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Abstract

THz Time-Resolved Photoconductivity is used to probe carrier dynamics in the dilute III-V nitride GaP0.49As0.47N0.036. In these measurements a femtosecond optical pump-pulse excites electron-hole pairs, and a delayed THz pulse measures the change in conductivity. We find the photoconductivity is dominated by localized carriers. The decay of photoconductivity after excitation is consistent with bimolecular electron-hole recombination with recombination constant r = 3.2 0.8 10-8 cm3 s-1. We discuss the implications for applications in solar energy.

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Heyman, J. N., Weiss, E. M., Rollag, J. R., Yu, K. M., Dubon, O. D., Kuang, Y. J., … Walukiewicz, W. (2018). THz transient photoconductivity of the III-V dilute nitride GaP y As1-y-xN x. Semiconductor Science and Technology, 33(12). https://doi.org/10.1088/1361-6641/aae7c5

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