CITATION STYLE
Liliental-Weber, Z., Kryliouk, O., Park, H. J., Mangum, J., Anderson, T., & Schaff, W. (2008). InN Nanorods and Epilayers: Similarities and Differences. In Microscopy of Semiconducting Materials 2007 (pp. 37–40). Springer Netherlands. https://doi.org/10.1007/978-1-4020-8615-1_8
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