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Journal ArticleOPEN ACCESS

Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM

  • Zaefferer S
  • Kleindiek S
  • Schock K
  • et al.
Microscopy and Microanalysis (2013) 19(S2) 1306-1307
DOI: 10.1017/s1431927613008520
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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APA

Zaefferer, S., Kleindiek, S., Schock, K., & Volbert, B. (2013). Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM. Microscopy and Microanalysis, 19(S2), 1306–1307. https://doi.org/10.1017/s1431927613008520

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