High-efficiency grating coupler in 400 nm and 500 nm PECVD silicon nitride with bottom reflector

18Citations
Citations of this article
23Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

We design and experimentally demonstrate highly efficient Silicon Nitride based grating couplers with bottom distributed Bragg reflectors. All the layers were deposited using plasma enhanced chemical vapor deposition processing. We present gratings on two Silicon Nitride thickness (400 nm and 500 nm) platforms. On a 500 nm thick Silicon Nitride, we show a peak coupling efficiency of −2.29 dB/coupler at a wavelength of 1573 nm with a 1 dB bandwidth of 49 nm. On a 400 nm thick platform, we demonstrate a coupling efficiency of −2.58 dB/coupler at 1576 nm with a 1 dB bandwidth of 52 nm. The demonstrated coupling efficiency is the best reported as yet, for both 400 nm and 500 nm thick, plasma deposited Silicon Nitride platforms.

Cite

CITATION STYLE

APA

Nambiar, S., Kumar, A., Kallega, R., Ranganath, P., & Selvaraja, S. K. (2019). High-efficiency grating coupler in 400 nm and 500 nm PECVD silicon nitride with bottom reflector. IEEE Photonics Journal, 11(5). https://doi.org/10.1109/JPHOT.2019.2936430

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free