Some considerations related to the use of the Scherrer equation in powder X-ray diffraction as applied to heterogeneous catalysts

Abstract

This short overview summarises some of the basic considerations which should be undertaken when the Scherrer equation is applied to reflection widths in X-ray diffraction patterns of heterogeneous catalysts in order to extract meaningful information. Frequently, little account has been taken of the apparent complications arising from the presence of microstructural strain and disorder such as that which can be introduced upon doping or of anisotropic effects and such considerations are highlighted.