XRMis a versatile and attractive tool, due to the large penetration depth of X-rays in matter, X-rays rich spectral structures and the various contrast mechanisms accessible (absorption, phase contrast, fluorescence) that allow scientific questions in many fields of science to be addressed. This contribution aims to provide an introduction to the physics behind XRM and to describe the current state of the art instrumentation, developments and analytical methodologies. The potential of XRM is illustrated with examples from materials, environment and life science.
CITATION STYLE
Eichert, D. (2015). X-ray microscopy. In Synchrotron Radiation: Basics, Methods and Applications (pp. 409–436). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-642-55315-8_14
Mendeley helps you to discover research relevant for your work.