Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR

Abstract

Performance advances in atom probe tomography (APT) in recent years have driven a dramatic increase in the number of APT articles published. One area of rapid research growth is analysis of fragile or insulating materials that require a laser-pulsed atom probe [1]. However, for multi-user facilities around the world, voltage pulsing is still used regularly (averaging ~40% of the experiments), and at some facilities voltage-pulsed analyses comprise greater than 60% of the experiments [2].