An efficient descriptor based on radial line integration for fast non-invariant matching and registration of microscopy images

Abstract

Descriptors such as SURF and SIFT contain a framework for handling rotation and scale invariance, which generally is not needed when registration and stitching of images in microscopy is the focus. Instead speed and efficiency are more important factors. We propose a descriptor that performs very well for these criteria, which is based on the idea of radial line integration. The result is a descriptor that outperforms both SURF and SIFT when it comes to speed and the number of inliers, even for rather short descriptors.