An ultrahigh vacuum scanning tunneling microscope for surface science studies

Abstract

We describe the construction and operation of a scanning tunneling microscope designed in our laboratory that fits standard ultrahigh vacuum (UHV) systems as an add-on instrument. Sample motion is accomplished by electrical signals, eliminating mechanical feedthroughs. Samples are easily transferred to a modified Varian manipulator for heating and interfacing with other surface science techniques. In situ tip replacement and sample transfer in and out of the UHV system is also possible.