Synthesis and characterization of (0001)-textured wurtzite Al1-xBxN thin films

Abstract

Al1-xBxN films of the wurtzite structure and a strong c-axis texture have been grown at room temperature by reactive sputter deposition with B concentrations of up to 10at.%. The crystallographic structure of the films has been studied with XRD and HRTEM/SAED with stoichiometry and chemical bonding determined by XPS. Nanoindentation experiments show that the films have a hardness in excess of 30GPa, which is retained after annealing for 1h at 1000°C. An amorphous phase is observed at the interface, the thickness of which increases with the B concentration in the film, while the film crystallinity is seen to improve with film thickness. © 2011 Elsevier B.V.