Temperature effects on electrical and structural properties of MEH-PPV/PEIE OLED Device

Abstract

This paper explores the performance of configuration ITO/MEH-PPV/PEIE/Al OLED under the variations of temperature. The MEH-PPV and MEH-PPV/PEIE thin film were deposited on ITO substrates using spin coating technique with fixed spin speed of 3000 rpm and baked at low temperature ranging from 90 °C to 180 °C, respectively. The surface roughness values for MEH-PPV and MEH-PPV/PEIE films were analysed using AFM with 5 μm ' 5 μm scanning area. The roughness of MEH-PPV thin films were reduced from 2.825 nm to 1.625 nm when temperature increased. Contrary to MEH-PPV/PEIE films where the roughness increased linearly up to 3.397 nm when the temperature increased. The maximum absorption peak spectrum obtained from UV-Visible (UV-Vis) was found at 500 nm to 510 nm when baked temperature were varied. Furthermore, the turn on voltage from J-V characteristics gives no specific pattern across different temperature and agreed with the trend of surface roughness values. The turn-on voltage at T = 150 °C gives the lowest value of 3 V. Overall, the variations of low temperature gives an effects on structural and electrical properties of this OLED configuration.