Abstract
A model is introduced in order to simulate the profiling process of a friction force microscope (FFM) tip scanning a sample surface. Starting from the equations of motion, complete friction force microscopy images as well as individual scan lines are calculated using a model potential for the tip-sample interaction which has the translational symmetry of a MoS2(001) surface. The subsequent analysis of the tip movement demonstrates the characteristic two-dimensional stick-slip behavior on the atomic scale.
Cite
CITATION STYLE
Hölscher, H., Schwarz, U. D., & Wiesendanger, R. (1997). Simulation of the Scan Process in Friction Force Microscopy. In Micro/Nanotribology and Its Applications (pp. 379–384). Springer Netherlands. https://doi.org/10.1007/978-94-011-5646-2_29
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