Characterisation of size distribution and positional misalignment of nanoscale islands by small-angle X-ray scattering

0Citations
Citations of this article
12Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

Highly ordered arrays of nanoscale magnetic structures form the basis of artificial spin ices, uniform particles for bio-medical applications, and data storage as Bit Patterned Media. We demonstrate that small-angle X-ray scattering (SAXS) allows the size distribution and the positional alignment of highly ordered arrays to be determined with high spatial and statistical accuracy. The results obtained from the SAXS measurements are compared to an analysis of Scanning Electron Microscopy images and found to be in excellent agreement. This confirms the validity of the technique and demonstrates its potential as a fast, accurate, and statistically reliable method for characterising arrays of ordered nanostructures.

Cite

CITATION STYLE

APA

Heldt, G., Thompson, P., Chopdekar, R. V., Kohlbrecher, J., Lee, S., Heyderman, L. J., & Thomson, T. (2019). Characterisation of size distribution and positional misalignment of nanoscale islands by small-angle X-ray scattering. Journal of Applied Physics, 125(1). https://doi.org/10.1063/1.5050882

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free