CITATION STYLE
Kondo, H., & Oikawa, T. (2009). Embedment-free section electron microscopy (EM): a highly potential advantage in application to EM tomography. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 319–320). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_160
Mendeley helps you to discover research relevant for your work.