CITATION STYLE
Okunishi, E., Kondo, Y., Sawada, H., Endo, N., Yasuhara, A., Endo, H., … Shinpo, T. (2009). Back-Scattered Electron microscopy in Aberration corrected Electron microscope. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 43–44). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_22
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